Potential Induced Degradation (PID) testing evaluates the ability of photovoltaic modules to resist potential-induced deterioration by simulating harsh electric field and humid heat conditions.

TECHNICAL PARAMETERS | ||
Item | Specification | |
DC Regulated Power Supply | 12 channels(Independently monitoring and control) Each channel can independently control the voltage polarity | |
Voltage range | -2000V ~ 2000V | |
Voltage resolution | 1V | |
Voltage stability | For continuous output of 1000V, 1500V, and 2000V, voltage fluctuation is ≤2% within 500 hours | |
Connection method | Module frame grounded, connector shorted and then connected to the high-voltage terminal; for negative voltage testing and positive voltage recovery, only switch toggling is needed, no change in connection method required | |
Voltage application method | 20 power channels operate independently, capable of outputting different polarities and voltages | |
Voltage accuracy | ±3% (referencing CNAS-CL01-A021:2018) | |
Voltage tolerance | 0.5% (referencing IEC 62804-1-1:2020) | |
Current measurement range | 0~1mA Resolution: 0.01μA (as specified in IEC 62804-1-1:2020) | |
Acquisition interval | ≤5min(adjustable at software) | |
Safety protection features | Overcurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber | |
Power | Single phase, 220V, 50Hz | |
TEST STANDARD | ||
Items | Description | |
Test Standard | IEC61215-2: 2021 MQT 21 Potential Induced Degradation Test IEC 62804-1-1:2020“Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation Part 1-1 Crystalline silicon – Delamination” IEC 63209:2019 Extended-stress testing of photovoltaic modules | |



