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HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
Specifications
Brand Name :
Haida
Model Number :
HD-E900
Certification :
ISO,CE
Place of Origin :
Guangdong, China (Mainland)
MOQ :
1 Set
Price :
Negotiable
Payment Terms :
L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability :
30 Sets per Month Haida
Delivery Time :
15 days after order confirmed
Packaging Details :
Export wooden case
Display Device :
PC
Unit Switchover :
G, KG, N, LB
Usage :
Tension Material Tension Strength Tester
Force Reading :
kgf, Ibf, N, KN, T etc
Grip :
Tensile grip, Tear force grip
Description
HD-E900 Potential Induced Degradation(PID) Test Machine
APPLICATION

Potential Induced Degradation (PID) testing evaluates the ability of photovoltaic modules to resist potential-induced deterioration by simulating harsh electric field and humid heat conditions.

TECHNICAL PARAMETERS
Item Specification
DC Regulated Power Supply 12 channels(Independently monitoring and control)
Each channel can independently control the voltage polarity
Voltage range -2000V ~ 2000V
Voltage resolution 1V
Voltage stability For continuous output of 1000V, 1500V, and 2000V, voltage fluctuation is ≤2% within 500 hours
Connection method Module frame grounded, connector shorted and then connected to the high-voltage terminal; for negative voltage testing and positive voltage recovery, only switch toggling is needed, no change in connection method required
Voltage application method 20 power channels operate independently, capable of outputting different polarities and voltages
Voltage accuracy ±3% (referencing CNAS-CL01-A021:2018)
Voltage tolerance 0.5% (referencing IEC 62804-1-1:2020)
Current measurement range 0~1mA
Resolution: 0.01μA (as specified in IEC 62804-1-1:2020)
Acquisition interval ≤5min(adjustable at software)
Safety protection features Overcurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber
Power Single phase, 220V, 50Hz
TEST STANDARD
Items Description
Test Standard IEC61215-2: 2021 MQT 21 Potential Induced Degradation Test
IEC 62804-1-1:2020“Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation Part 1-1 Crystalline silicon – Delamination"
IEC 63209:2019 Extended-stress testing of photovoltaic modules
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HD-E900 Potential Induced Degradation(PID) Test Machine

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Product Detail
Brand Name :
Haida
Model Number :
HD-E900
Certification :
ISO,CE
Place of Origin :
Guangdong, China (Mainland)
MOQ :
1 Set
Price :
Negotiable
Contact Supplier
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HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine
HD-E900 Potential Induced Degradation(PID) Test Machine

Guangdong Haida Equipment Co., Ltd.

Verified Supplier
12 Years
guangdong, dongguan
Since 2004
Business Type :
Manufacturer, Seller
Main Products :
Lab Test Machines, Paper And Board Strength Testing, Environmental Test Chamber
Total Annual :
$ 5 Million-US$ 10 Million
Employee Number :
200~300
Certification Level :
Verified Supplier
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