Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer
I. Overview
LR-A426 is an integrated in-situ spectroscopic ellipsometer designed for organic/inorganic coatings. The need for membrane process research is to develop customized in-situ film online monitoring technology. Develop and rapidly implement in-situ characterization and analysis of optical films.
II. Test Cases

Film-forming process monitoring

Film thickness characterization

III. Product Applications
It is widely applied in the physical/chemical vapor deposition, ALD deposition and other optical film processing procedures of metal films, organic films and inorganic films. It can conduct in-situ online monitoring during the process and provide real-time feedback on the measured physical property data.
Integrated In-situ Spectroscopic Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer
Technical Specification
| Incident angle | 65° |
| Beam deviation | < 0.3° |
| Measurement parameters | Psi&Del,TanPsi&CosDel,Alpha&Beta |
| Polarizers | Glan-Thompson |
| Material | a-BBO |
| Compensator | quarter-wave phase delay, hyper achromatic |
| Intensity selection | Linear optical density selection element. Ensures good signal-to-noise ratio in measurement process, improves data accuracy, |
| Optical design | dual fiber convey the light from lamp to spectrometer through polarization elements;stable light path, convenient to change lamps |
| Fiber | anti-UV passivation; NA=0.22;clear aperture 600um |
| Micro light spot | diameter ≤200um, to distinguish between the useful light reflected from front surface and the useless light reflected from the |
| Slit | 1 50um, for distinguishing between the useful light reflected from front surface and the useless light reflected from the bottom |


