MachineU > China Products

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

Specifications

Brand Name :

Phidix

Model Number :

M22001

Certification :

IATF16949，CE

Place of Origin :

China

MOQ :

Negotiable

Price :

Negotiable

Payment Terms :

L/C, D/A, D/P, T/T, Western Union

Supply Ability :

10 PCS/Month

Delivery Time :

40 Work Days

Packaging Details :

1 PC/Wooden Box

Color :

White

Customization :

OEM, ODM

Packing :

1 PC/Carton

Warranty :

1 year

Lead-time :

40 Work Days

Resolution :

15nm, 20nm

Magnification :

60,000X

Accelerating Voltage :

5kV to 30kV

Signal Detection :

(SEI)-Secondary Electron Image

Electron Gun :

Filament type, Pre Centered tungsten filament Cartridge

Max Sample size :

70mm in diameter, 30mm in height

Image format :

BMP, JPEG, PNG,TIFF

Vacuum system :

High Vacuum Mode

Description

Magnification Max 60,000X Scanning Electron Microscope 15nm Resolution with Optional EDS

As the basic desktop SEM, M22001 series can meet the basic experimental needs of most users. It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:

Specials:

- Magnification Max 60,000X.

- Signal Detection: SE Detector+BSE Detector.

- Accelerating Voltage:5kV to 30KV, High image resolution.

- EDS is optional, for component analysis.

- High Vacuum System.

- Tilt Stage configuration (0~45°)( optional).

Item	Specification		M22001
Resolution	15nm (30kV, SE Image)		●
	20nm (30kV, BSE Image)		●
Magnification	30x~60,000x		●
Accelerating Voltage	5kV to 30kV (5kV/10kV/15kV/20kV/30kV-5 step)		●
Signal Detection	(SEI)-Secondary Electron Image		●
	(BSEI)-Backscattered Electron Image		○
	* Multi Detector (SEI+BSEI)		○
Observation mode	Standard Mode		●
	Charge-up reduction mode		●
Electron Gun	Filament type, Pre Centered tungsten filament Cartridge		●
	Bias voltage system, Automatic mode		●
	Electron gun alignment, Manual mode		●
Lens system	Focus Lens, 2-stage Electromagnetic Condenser Lens		●
	Objective Lens, 1-stage Electromagnetic Objective Lens		●
	Detector type, SE Detector/ BSE Detector		●
Stage system	Auto or Manual Stage Traverse, 3 axis system, X, Y-axis : 35mm / R-axis: 360°		●
Image shift	Image shift X, Y Image Shift (±150um)		●
Max sample size	70mm in diameter, 30mm in height		●
Image scanning system	Fast Scan: 320x240 (Scan time: 0.1 sec.)		●
	Slow Scan: 640x480 (Scan time: 3 sec.)		●
	Photo Mode 1: 1280x960		●
	Photo Mode 2: 2560x1920		●
	Photo Mode 3: 5120x3840		●
Image format	BMP, JPEG, PNG,TIFF		●
Data display	Magnification, Detector type, Accelerating Voltage, Vacuum mode, Logo(Text), Date and time, Text marker, scale bar		●
Vacuum system	Fully Automatic Multi mode, High vacuum Rotary Pump/100Liters/min Turbo Molecular Pump/ 70Liters/sec pump down time: less than 3 minutes		●
Control unit system	Mouse, Keyboard PC		●
Software function	Image file open, edit, Save function Length, area, angle measuring parameter initialization, mage capture mode conversion), Archives, Setting(EDS)		●
Volume	Main Unit-460(W)×600(D)× 950(H)mm……1set External vacuum pump-400(W)×160(D)×340(H)mm …1set		●
Weight	99kg		●
Equipment environment	Temperature: 15℃~30℃ Humidity: 70% or less Power source: Single phase 200~240V AC, 1KW, 50/60Hz		●
Accessories package:
Pre Centered tungsten filament		5 pcs/box	●
Sample Stage		15mm dia. (10 pcs)	●
		25mm dia. (10 pcs)	●
		15mm 45° Tilt (5 pcs)	●
		15mm 90° Tilt (5pcs)	●
Height standard master		1ea	●
allen wrench		1set	●
SEM Software CD		1ea	●
Carbon conductive tape		1roll	●
scissors		1ea	●
tweezers		1ea	●
Tools Box		1ea	●

Note: ● means standard, ○ means optional

The sample test results

We conducted a practical test using a defective screw that was discarded in the laboratory as a sample. The pictures are as follows: