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Wafer-Level Atomic Force Microscoperoscope
Wafer-Level Atomic Force Microscoperoscope
Specifications
Brand Name :
Truth Instruments
Model Number :
AtomEdge Pro
Place of Origin :
CHINA
MOQ :
1
Price :
Price Negotiable | Contact us for a detailed quote
Payment Terms :
T/T
Name :
Atomic Force Microscopes
Scanning Angle :
0~360"
Scanning Range :
Maximum 100μm * 100μm * 910μm
Sample Size :
Compatible with 8-inch wafers and below
Multi-Function Measurement :
EFM,KFM,PFM,MFM
Scan Speed :
0.1Hz-30Hz
Description
Wafer-Level Atomic Force Microscope
Product Model:

AtomMax

Product Overview:

Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments.

Equipment Performance Specifications
Parameter Specification
Sample Size Compatible with 8-inch wafers and below
Scanning Range Maximum 100μm * 100μm * 910μm
Scanning Angle 0~360"
Resolution Z-axis closed-loop resolution 0.15 nm; X/Y closed-loop resolution 0.5 nm
Scanning Probe XY Direction lmage Resolution Not less than 32x32~4000x4000
Operating Modes Contact mode, tapping mode, phase imaging mode, lift mode, multi-directional scanning mode
Multi-Function Measurement EFM,KFM,PFM,MFM

Application Cases

Wafer-Level Atomic Force Microscoperoscope

  • Potential of the Au-Ti strip electrode sheet
  • Scanning mode: KPFM (lift-mode)
  • Scanning range: 18μm * 18μmTitanium Film - Aluminum Titanate Film

Wafer-Level Atomic Force Microscoperoscope

  • Electrostatic force of the Au-Ti strip electrode sheet
  • Scanning mode: EFM (lift mode)
  • Scanning range: 18μm * 18μm

Wafer-Level Atomic Force Microscoperoscope

  • Magnetic domains in Fe-Ni thin films
  • Scanning mode: MFM (lift-mode)
  • Scanning range: 14μm * 14μm

Wafer-Level Atomic Force Microscoperoscope

  • PbTiO3-piezoelectric corresponding vertical amplitude image
  • Scanning mode: PFM (contact-mode)
  • Scanning range: 20μm * 20μm
Wafer-Level Atomic Force Microscoperoscope
  • Co/Pt Thin Film
  • Scanning Mode: Magnetic Force Microscopy (MFM)
  • Scanning Range: 25 μm * 25 μm
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Wafer-Level Atomic Force Microscoperoscope

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Product Detail
Brand Name :
Truth Instruments
Model Number :
AtomEdge Pro
Place of Origin :
CHINA
MOQ :
1
Price :
Price Negotiable | Contact us for a detailed quote
Payment Terms :
T/T
Contact Supplier
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Wafer-Level Atomic Force Microscoperoscope

Truth Instruments Co., Ltd.

Verified Supplier
1 Years
shandong, qingdao
Since 2019
Business Type :
Manufacturer
Main Products :
Atomic Force Microscope, Kerr Microscope, Vibrating Sample Magnetometer
Total Annual :
15.000.000-20.000.000
Employee Number :
100~200
Certification Level :
Verified Supplier
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