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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Specifications
Brand Name :
Truth Instruments
Model Number :
AtomEdge Pro
Place of Origin :
CHINA
MOQ :
1
Price :
Price Negotiable | Contact us for a detailed quote
Payment Terms :
T/T
Description
Product Introduction

The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various techniques such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions to particular research fields and creating a highly efficient, multi-purpose inspection platform.

Equipment Performance
Item Specification
Sample Size Compatible with samples with a diameter of 25 mm
Scanning Method XYZ Three-Axis Full-Sample Scanning
Scanning Range 100 μm × 100 μm × 10 μm
Scanning Rate 0.1 Hz - 30 Hz
Z-Axis Noise Level 0.04 nm
Nonlinearity XY Direction: 0.02%; Z Direction: 0.08%
Image Sampling Points 32×32 - 4096×4096
Operating Mode Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-Directional Scanning Mode
Multifunctional Measurements

Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (Scm), Magnetic Force Microscope (MFM); Optional: Conductive Atomic Force Microscope (C-AFM)

Applications

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Strontium titanate(STO) Tap mode

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Maze Domain and Skyrmions in mTJ Stack:SAF/MgO/Ta/Co/Pt)₉ Magnetic Force Microscope(MFM)

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Bismuth vanadate thin filmScanning Kelvin Microscope(KPFM)

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Perovskite (FAPbI₃) Conductive Atomic ForceMicroscope (C-AFM)

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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

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Product Detail
Brand Name :
Truth Instruments
Model Number :
AtomEdge Pro
Place of Origin :
CHINA
MOQ :
1
Price :
Price Negotiable | Contact us for a detailed quote
Payment Terms :
T/T
Contact Supplier
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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Truth Instruments Co., Ltd.

Verified Supplier
1 Years
shandong, qingdao
Since 2019
Business Type :
Manufacturer
Main Products :
Atomic Force Microscope, Kerr Microscope, Vibrating Sample Magnetometer
Total Annual :
15.000.000-20.000.000
Employee Number :
100~200
Certification Level :
Verified Supplier
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