MachineU > China Products
AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications
AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications
Specifications
Description
Multi-Functional Atomic Force Microscope - AtomEdge Pro
Product Introduction

The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.

Equipment Performance
Index Specification
Sample Size 25 mm
Scanning Method XYZ three-axis full sample scanning
Scanning Range 100 μm×100 μm×10 μm
Scanning Rate 0.1-30 Hz
Noise Level In The Z Direction 0.04 nm
Nonlinearity 0.15% in the XY direction and 1% in the Z direction
Image Sampling Point The maximum resolution of the scanning probe image is 4096×4096
Working Mode Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode
Multifunctional Measurement Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM), force curve
Applications

AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

Send your message to this supplier
Send Now

AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

Ask Latest Price
Product Detail
Contact Supplier
AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

Truth Instruments Co., Ltd.

Verified Supplier
1 Years
shandong, qingdao
Since 2019
Business Type :
Manufacturer
Main Products :
Atomic Force Microscope, Kerr Microscope, Vibrating Sample Magnetometer
Total Annual :
15.000.000-20.000.000
Employee Number :
100~200
Certification Level :
Verified Supplier
Discover similar products
View More

Find Similar Products By Category:

Supplier Homepage Products Atomic Force Microscope
MachineU China Products
Contact Supplier
Submit Requirement