YOUFU UF-FTO85BD134-001 Dual Head Spring Loaded Pogo Pins
High precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities for semiconductors and SiC wafers.
Key Product Features
- High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
- Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
- Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
- Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Product Images
Detailed Component Illustration
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
- Custom diameters to match your specific requirements
- Custom plating thicknesses for optimal conductivity and durability
- Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process