These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.
Product Specifications
| Specification | Details |
| Type | Probe test pin |
| Material | Brass |
| Plating Layer | Gold Plated |
| Color | Gold |
| Package | PE Bag |
| Current resistance | 50mΩ |
| MOQ | 100PCS |
| Payment | T/T |
| Delivery time | 5-10 days after receiving payment |
Test Probe Selection Guide
Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.
Detailed illustration of test probe components and construction
Various test probe tip types
Customization Options
At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:
- Custom diameters to match your specific requirements
- Custom plating thicknesses for optimal conductivity and durability
- Custom mechanical specifications tailored to your application
All products include: Material traceability documentation and certificate of analysis for quality assurance.
Contact us to request samples or a quotation for your specific application requirements.
Our probe manufacturing facility
Quality control inspection
Packaged probes ready for shipment