The Keithley 6517B Electrometer/High Resistance Meter is the worldwide research laboratory standard for sensitive low-level measurements. With over 60 years of expertise in low-level measurement technology, this instrument delivers unparalleled accuracy for current, voltage, resistance, and charge measurements in demanding research and industrial applications.

• Ultra-Low Current Measurement: 10 aA (10×10⁻¹⁸ A) resolution with <3 fA input bias current and just 0.75 fA p-p noise
• Ultra-High Resistance Range: Measures resistances up to 10¹⁸ Ω using the patented Alternating Polarity Method
• High Impedance Voltage Measurement: 1 µV to 200 V range with >200 TΩ input impedance
• Built-in ±1000 V Voltage Source: With sweep capability for leakage, breakdown, and resistivity testing
• 6½-Digit High Accuracy Mode: Provides precise, repeatable measurements across all ranges
• < 20 µV Burden Voltage: On lowest current ranges, minimizing measurement interference

The 6517B uses the Alternating Polarity Method which virtually eliminates the effect of any background currents in the sample. First and second order drifts of background currents are canceled out. The instrument applies a voltage of positive polarity, measures current after a specified delay, then reverses polarity and measures again. Resistance is calculated based on a weighted average of the four most recent current measurements, producing highly repeatable, accurate resistivity readings.

When combined with the 8009 Resistivity Test Fixture and the KickStart High Resistivity Application, the 6517B forms a complete ASTM D257-compliant measurement solution for volume and surface resistivity testing of insulating materials. The system supports test voltages up to 1000 V and resistivity measurements up to 10¹⁸ Ω-cm.

• Diode leakage current measurement
• Capacitor leakage current measurement
• Cable insulation resistance measurement
• Resistor voltage coefficient measurement
• Volume resistivity testing
• Surface resistivity testing
• Surface insulation resistance (SIR) testing
• Square wave and staircase voltage sweep tests

• Nanomaterial characterization
• Polymer electrical characterization
• Beam measurements and dosimetry
• Device leakage current measurements
• Insulation resistance measurements
• Optoelectronic detector characterization
• Solar cell characterization (ultra-low voltage burden)
• Electrochemistry (ion-selective electrodes, pH, conductivity cells)

GPIB and RS-232 interfaces for remote control and data acquisition. Optional 6521 Low Current Scanner Card (10-channel, BNC) and 6522 Voltage/Low Current Scanner Card (10-channel, Triax) available for multipoint testing automation.

Referenced in thousands of research papers worldwide, the Keithley 6517B combines decades of low-level measurement expertise into an instrument that operates as simply as a digital multimeter while delivering the sensitivity required for cutting-edge research in physics, optics, nanotechnology, and materials science.