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Glass Substrate Surface Defect Detection Equipment 1.8um
Glass Substrate Surface Defect Detection Equipment 1.8um
Specifications
Brand Name :
ZEIT
Model Number :
SDD-GS-X—X
Certification :
Case by case
Place of Origin :
Chengdu, P.R.CHINA
MOQ :
1set
Price :
Case by case
Payment Terms :
T/T
Supply Ability :
Case by case
Delivery Time :
Case by case
Packaging Details :
Wooden case
Size :
Customizable
Customizable :
Available
Guarantee period :
1 year or case by case
Shipping Terms :
By Sea / Air / Multimodal Transport, etc
Description

Glass Substrate Surface defect detector

Applications

For the process control and yield management of glass substrate manufacturing, we can help manufacturers to

identify and monitor the mask defects, reduce the risk of yield and improve their independent ability of R&D for

core technologies.

Working Principle

Using specific angle ring light, coaxial light source and running mechanism to collect and analyze the directional

photography information, thus realizing automatica detection for the defects on the glass substrate surface.

Features

Model SDD-GS-X—X

Performance detection

 Detectable defect type Scratches, Dusts
Detectable defect size 1μm
Detection accuracy (measured)

100% detection of defects / collection of

defects (scratches, dust)
Detection efficiency

≤10 minutes

( Measured value : 350mm x 300mm Mask)

Optical System Performance

 Resolution 1.8μm
Magnification 40x
Field of view 0.5mm x 0.5mm
Blue light illumination 460nm, 2.5w

Motion Platform Performance

X, Y two-axis motion

Marble countertop flatness: 2.5μm

Y-axis Z-direction runout precision: ≤ 10.5μm

Y-axis Z-direction runout precision: ≤8.5μm
Note: Customized production available.

Detection Images

Glass Substrate Surface Defect Detection Equipment 1.8um

Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.

Our ISO Certification

Glass Substrate Surface Defect Detection Equipment 1.8um

Parts Of Our Patents

Glass Substrate Surface Defect Detection Equipment 1.8umGlass Substrate Surface Defect Detection Equipment 1.8um

Parts Of Our Awards and Qualifications of R&D

Glass Substrate Surface Defect Detection Equipment 1.8umGlass Substrate Surface Defect Detection Equipment 1.8um

Product tags

lcd shore hardness tester

,

wafer inspection

,

uv visible spectrometer parts
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Glass Substrate Surface Defect Detection Equipment 1.8um

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Product Detail
Brand Name :
ZEIT
Model Number :
SDD-GS-X—X
Certification :
Case by case
Place of Origin :
Chengdu, P.R.CHINA
MOQ :
1set
Price :
Case by case
Contact Supplier
Glass Substrate Surface Defect Detection Equipment 1.8um

ZEIT Group

Active Member
4 Years
sichuan, chengdu
Since 2018
Business Type :
Manufacturer, Exporter, Seller
Main Products :
Optical Coating Equipment, Optical Testing Equipment, Photomask Substrate
Total Annual :
＄10,000,000-＄15,000,000
Employee Number :
120~200
Certification Level :
Active Member
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