✔ Micron-Level Accuracy – Measures inner/outer diameters (Ø0.5mm~500mm) with ±5μm repeatability
✔ Defect Detection Mastery – Identifies:
→ Surface flaws (nicks, bubbles, flash)
→ Cross-section deformities (flat spots, ovality >0.1%)
→ Contamination (embedded particles >20μm)
✔ Multi-Spectral Imaging – Combines visible light + IR for silicone/NBR/FKM material variants
Optics: 10MP global shutter CCD with 5X telecentric lens
Throughput: 1,200 pcs/hour (auto-loading compatible)
Tolerance Control: Automatic SPC analysis (Cp/Cpk ≥1.67)
Output: NG ejection + QR code traceability logging