✔ Dual-Station Parallel Inspection – 2X Throughput (Up to 800 pcs/min)
✔ Transparent/Non-Transparent Compatibility – Dual-side illumination (Diffused + Coaxial) for clear/opaque plastics
✔ Nanoscale Defect Detection – Identifies:
→ Surface defects (scratches ≥10μm, flow marks)
→ Structural flaws (warpage >0.05mm, short shots)
→ Contaminants (foreign particles ≥30μm)
Optical System: Dual 12MP CMOS + 3D laser triangulation (Z-axis ±2μm)
Conveyance: Dual servo-driven glass tables (anti-static coating)
Lighting: 8-zone programmable strobes (RGBW spectrum)
Sorting Speed: 0.5ms decision time with pneumatic reject gates