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Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Specifications
Brand Name :
OPTO-EDU
Model Number :
A62.4503
Certification :
CE, Rohs
Place of Origin :
China
MOQ :
1pc
Price :
FOB $1~1000, Depend on Order Quantity
Payment Terms :
L/C,T/T,Western Union
Supply Ability :
5000 pcs/ Month
Delivery Time :
5~20 Days
Packaging Details :
Carton Packing, For Export Transportation
Work Mode :
"Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
Current Spectrum Curve :
"RMS-Z Curve F-Z Force Curve"
XY Scan Range :
50×50um
XY Scan Resolution :
0.2nm
Z Scan Range :
5um
Y Scan Resolution :
0.05nm
Scan Speed :
0.6Hz~30Hz
Scan Angle :
0~360°
Sample Size :
"Φ≤90mm H≤20mm"
Shock-Absorbing Design :
"Spring Suspension Metal Shielding Box"
Optical Syestem :
"10x Objective Resolution 1um"
Output :
USB2.0/3.0
Software :
Win XP/7/8/10
Description
Contact Mode, Tapping Mode, Scan Range XY 50x50um, Z 5um, Scan Resolution XY 0.2nm, Z 0.05nm, Sample Size Dia.<90mm, H<20mm, Stage Moving 25x25mm, Optical Objective APO 10x Resolution 1um, Scan Speed 0.6~30Hz, Scan Angle 0-360°, WinXP/7/8/10, USB2.0/3.0, Spring Suspension Damping
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

◆ Precision probe positioning device, laser spot alignment adjustment is very easy

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

Specification A62.4500 A62.4501 A62.4503 A62.4505
Work Mode Tapping Mode

【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum Curve RMS-Z Curve

【Optional】
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve
XY Scan Range 20×20um 20×20um 50×50um 50×50um
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5um 2.5um 5um 5um
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25um 25×25um
Shock-Absorbing Design Spring Suspension Spring Suspension
Metal Shielding Box		 Spring Suspension
Metal Shielding Box		 -
Optical Syestem 4x Objective
Resolution 2.5um		 4x Objective
Resolution 2.5um		 4x Objective
Resolution 2.5um		 Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10

Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
　 Resolution Working Condition Working Temperation Damge to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperation None 1~2 Atom Level
TEM Point 0.3~0.5nm
Lattice 0.1~0.2nm		 High Vaccum Room Temperation Small Usually <100nm
SEM 6-10nm High Vaccum Room Temperation Small 10mm @10x
1um @10000x
FIM Atom Level 0.1nm Super High Vaccum 30~80K Damge Atom Thickness
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (um) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase charge distribution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution
Product tags

trinocular inverted metallurgical microscope

,

trinocular inverted microscope

,

zeiss inverted microscope
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Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

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Product Detail
Brand Name :
OPTO-EDU
Model Number :
A62.4503
Certification :
CE, Rohs
Place of Origin :
China
MOQ :
1pc
Price :
FOB $1~1000, Depend on Order Quantity
Contact Supplier
Opto Edu Research Level Atomic Force Microscope with 360 Angle 50×50um XY Scan Range and 0.2nm Resolution

Opto-Edu (Beijing) Co., Ltd.

Verified Supplier
13 Years
beijing, beijing
Since 1995
Business Type :
Manufacturer, Distributor/Wholesaler, Exporter, Trading Company, Seller
Main Products :
Compound Optical Microscope, Stereo Optical Microscope, Digital Optical Microscope
Total Annual :
6000000-8000000
Employee Number :
10~20
Certification Level :
Verified Supplier
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