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Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Specifications
Brand Name :
Sanxin
Model Number :
SX1407
Certification :
ISO9001
Place of Origin :
Zhuzhou,China
MOQ :
2
Payment Terms :
L/C,T/T,Western Union
Delivery Time :
5-25days
Item Name :
Tungsten Needle
Characters :
Wear- resistance, Anti-corrosion
Hardness :
HRA 90-92
Advantage :
High Wear Resistance,Long Life
Shape :
Pin
Carbide Grade :
Yg6, Yg8, Yg10, etc
Surface Treatment :
Well ground and polished
Service :
ODM,OEM,OEM&ODM
Quality Grade :
K30,YG10X,K40,P10...
Main Feature :
Wear-Resistant
Tolerance :
h6
Description

Micron-grade Conductive Pioneer Nickel-plated Custom Tungsten Carbide Needle


The precision probe with electroplated nickel layer, with ultra-low contact resistance of 0.02Ω and HV500 hardness coating, overcomes the wear and oxidation pain points of ordinary gold-plated needles, and achieves zero-attenuation transmission of microampere-level signals in the fields of semiconductor testing and medical electrodes.


Spec-matrix:


Parameter Standard Value Ultimate Accuracy Test Standard
Diameter Range Φ0.1-2.0mm Φ0.05mm (Microneedle Laser Diameter Gauge
Coating Thickness 5±0.5μm ±0.2μm XRF Spectrometer
Straightness ≤0.003mm/30mm 0.001mm/30mm VDI 2617
Coating Hardness HV500±50 Nanoindenter Fully Tested ISO 14577
Contact Resistance 0.02Ω±0.005Ω Four-Wire Measurement IEC 60512

Note: The above data is for reference only, please contact us for customization.


Performance Advantages:


- Contact Resistance: 0.02-0.05Ω (90% lower than stainless steel pins)
- Wear Life: >1,000,000 plug-in/plug cycles
- Corrosion Resistance: Passed 96h salt spray test


Application:


Semiconductor Testing
- Wafer-Level Probe Card (0.1mm Φ Microneedle Array)
- BGA Package Testing (50μm Pitch Continuity)
- Third-Generation GaN Semiconductor Device Testing (High Temperature Resistance up to 400°C)


Medical Electronics
- Implantable Neural Electrodes (Biocompatibility Certified)
- Blood Glucose Monitor Probes (Resistant to Antibody Corrosion)
- Endoscope Contacts (>500 Sterilization Cycles)


Precision Industry
- PCB Flying Probe Testing (0.3mm Continuity)
- New Energy Battery Probes (Resistant to Electrolyte Corrosion)
- Micro Connectors (Insertion and Removal Force ≤0.5N)


Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing


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Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing

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Product Detail
Brand Name :
Sanxin
Model Number :
SX1407
Certification :
ISO9001
Place of Origin :
Zhuzhou,China
MOQ :
2
Payment Terms :
L/C,T/T,Western Union
Contact Supplier
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing

Zhuzhou Sanxin Cemented Carbide Manufacturing Co., Ltd

Verified Supplier
7 Years
hunan, zhuzhou
Since 2003
Business Type :
Manufacturer, Importer, Exporter, Seller, Other
Main Products :
Tungsten Carbide Processing, Tungsten Carbide Button, Tungsten Carbide Bar
Total Annual :
8000000-10000000
Employee Number :
150~180
Certification Level :
Verified Supplier
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