18V 1A PXI SMU Four Channel Sub Card DC Source Meter Unit CS402

The CS402 is a modular SMU solution designed for high-volume device testing, featuring an innovative common-ground architecture with 4 channels integrated per subcard. When paired with the CS1010C host system, it enables synchronized control of up to 40 channels—reducing system integration costs by 50% compared to traditional single-channel instruments. Optimized for high-throughput scenarios including LED/OLED production-line aging tests and semiconductor wafer multi-probe parallel inspection.

Product Features

▪ Flexible Software Integration: Supports SCPI commands and DLL drivers for automated test workflows.

▪ Four-channel Synchronization: Simultaneous sourcing/measurement across all channels with μs-level timing alignment.

▪ Isolation Design: Independent physical isolation between channels and electrical isolation between subcards.

▪ Multi-functional Modes: Combines voltage/current source, voltmeter, ammeter, and electronic load functionalities.

▪ Precision Measurement: 2-wire/4-wire (Kelvin) measurement modes for high-accuracy low-resistance testing.

▪ High Accuracy: Achieves ±0.1% basic accuracy across full ranges in both sourcing and sinking modes.

Product Parameters

Applications

▪ Semiconductor Device Testing:Static parameter measurement and dynamic characteristic analysis of discrete devices (MOSFETs, diodes, BJTs).

▪ Nanomaterials & Organic Electronics:Resistivity and Hall-effect testing for graphene, nanowires, and e-ink materials.

▪ Energy Device Evaluation:Energy efficiency assessment and I-V curve scanning for solar cells, DC-DC converters, and batteries.

▪ Sensor Calibration:Sensitivity and response performance testing for gas-sensitive/pressure-sensitive resistors and temperature sensors.

▪ Multi-channel Parallel Testing:High-throughput applications including LED/AMOLED panel aging tests and batch quality inspection for mass-produced devices.