Specifications
Brand Name :
ZL
Model Number :
ZL-1210
Certification :
CE,ISO
Place of Origin :
China
MOQ :
1 set
Price :
Negotiable
Payment Terms :
L/C, T/T, Western Union
Supply Ability :
60 Sets
Delivery Time :
5-8 work days
Packaging Details :
ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers is packaged within wooden case.
Product name :
ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers
Test range :
0~2 mm (conventional) 0~6 mm; 12 mm (optional)
Measuring speed :
10 times/min (adjustable)
Test pressure :
17.5±1 KPa (film); 50±1 KPa (paper)
Sample injection step :
0~1000 mm
Sample injection speed :
0.1~99.9 mm/s
Power supply :
AC 220V 50Hz
Net weight :
32 kg
Description
ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper, Silicon Wafers
Overview

The ZL-1210 Thickness Gauge employs mechanical contact measurement methodology, strictly adhering to standard requirements to ensure testing standardization and accuracy. This professional instrument is designed for precise thickness measurement of various materials including plastic films, sheets, diaphragms, paper, foils, silicon wafers, and more within the specified measuring range.

Key Features
  • Strictly designed contact area and measured pressure compliant with standards, with support for various non-standard customizations
  • Automatically raised and lowered measuring head during testing to eliminate human-induced system errors
  • Dual automatic and manual measurement modes for flexible user operation
  • Automatic sample injection with user-configurable parameters including sampling step, measuring points, and sampling speed
  • Real-time display of analytical data including maximum, minimum, average, and standard deviation measurements
  • Equipped with standard gauge blocks for system calibration to ensure test accuracy and data consistency
  • Comprehensive functionality including real-time data display, automatic statistics, and printing capabilities
  • Microcomputer-controlled system with LCD display, menu interface, and PVC operation panel for intuitive operation
  • Standard USB interface for external computer connectivity and data transfer
Applications
Basic Applications
Sheets, diaphragms, paper, cardboard, foil, silicon wafers, metal sheets, textile materials, solid electrical insulators, non-woven fabric materials, and products such as diapers and sanitary napkin sheets
Testing Principle

The ZL-1210 film thickness measuring instrument utilizes mechanical contact measurement principles. A specific pattern size is intercepted, and through control panel buttons, the measuring head is adjusted to contact the pattern. The pressure generated between the two contact surfaces and the measured values from the two contact areas are processed by the sensor to determine material thickness.

Compliance Standards

This instrument complies with numerous national and international standards: ISO 4593, ISO 534, ISO 3034, GB/T 6672, GB/T 451.3, GB/T 6547, ASTM D374, ASTM D1777, TAPPI T411, JIS K6250, JIS K6783, JIS Z1702, BS 3983, BS 4817

Technical Specifications
Parameter Specification
Model ZL-1210 Film Thickness Gauge
Test Range 0-2 mm (conventional); 0-6 mm; 12 mm (optional)
Resolution 0.1 μm
Measuring Speed 10 times/min (adjustable)
Test Pressure 17.5±1 KPa (film); 50±1 KPa (paper)
Contact Area 50 mm² (film); 200 mm² (paper)
Note: Choose film or paper configuration; non-standard customizations available
Sample Injection Step 0-1000 mm
Sample Injection Speed 0.1-99.9 mm/s
Power Supply AC 220V 50Hz
Dimensions 461 mm(L) × 334 mm(W) × 357 mm(H)
Net Weight 32 kg
Standard Configuration
Component Description
Standard Configuration Host unit, one standard gauge block, communication cable, measuring head
Optional Parts Non-standard measuring head, counterweight, professional software
ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers
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ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Ask Latest Price
Brand Name :
ZL
Model Number :
ZL-1210
Certification :
CE,ISO
Place of Origin :
China
MOQ :
1 set
Price :
Negotiable
Contact Supplier
ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers
ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers
ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Dongguan Zhongli Instrument Technology Co., Ltd.

Verified Supplier
9 Years
guangdong, dongguan
Since 2014
Business Type :
Manufacturer
Total Annual :
1 Million-2.5 Million
Employee Number :
100~150
Certification Level :
Verified Supplier
Contact Supplier
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