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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection
ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection
Specifications
Brand Name :
ZEIT
Model Number :
S1200- 150
Certification :
Case by case
Place of Origin :
Chengdu, P.R.CHINA
MOQ :
1set
Price :
Case by case
Payment Terms :
T/T
Supply Ability :
Case by case
Delivery Time :
Case by case
Packaging Details :
Wooden case
Size :
820mm*700mm*760mm, Customizable
Customizable :
Available
Guarantee period :
1 year or case by case
Shipping Terms :
By Sea / Air / Multimodal Transport, etc
Description

Structural Light Large Size Surface Shape Detection Equipment

Applications

Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection.

Working Principle

The display projects the structured light in stripe form, and the camera collects the structured light from the measured

surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution

and curvature distribution of the measured surface are calculated according to the deformation of the stripe, then the

surface shape error distribution can be obtained by comparing point cloud distribution with ideal model.

Features

Model SI200-150
Measuring range 200×150mm2
Transverse resolution Conventional 0.25mm, adjustable
Measuring precision Absolute error: ±3μm (100mm in diameter)
Note: Customized production available.

Detection Image

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.

Our ISO Certification

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

Parts Of Our Patents

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect DetectionZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

Parts of Our Awards and Qualifications of R&D

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect DetectionZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

Product tags

optical surface profiler

,

studio light reflector

,

5mm led reflector
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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

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Product Detail
Brand Name :
ZEIT
Model Number :
S1200- 150
Certification :
Case by case
Place of Origin :
Chengdu, P.R.CHINA
MOQ :
1set
Price :
Case by case
Contact Supplier
ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

ZEIT Group

Active Member
4 Years
sichuan, chengdu
Since 2018
Business Type :
Manufacturer, Exporter, Seller
Main Products :
Optical Coating Equipment, Optical Testing Equipment, Photomask Substrate
Total Annual :
＄10,000,000-＄15,000,000
Employee Number :
120~200
Certification Level :
Active Member
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