HXRF-450S Energy Dispersion X-ray Fluorescence Spectrometer Coating Thickness Analyzer
Product Specifications
| Attribute |
Value |
| Measurement element range |
Aluminum (Al) - uranium (U) |
| Detector |
SDD |
| Test time |
10-40s |
| Tube current |
0-1mA (Program-controlled) |
| High pressure |
0-50kV (Program-controlled) |
| Magnification |
Optics: 40-60× |
| Input voltage |
AC220V±10% 50/60HZ |
Product Overview
The HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester is a high-performance instrument designed for precise coating thickness measurement and material analysis across various industries.
Working Conditions
- Operating temperature: 15-30℃
- Relative humidity: 40%~50%
- Power supply: AC: 220V ± 5V
Technical Performance
- Excellent long-term stability with minimal calibration requirements
- No sample preparation needed for coating systems, solid or liquid samples
- Comprehensive performance including coating analysis, qualitative/quantitative analysis, bath analysis, and statistical functions
Applications
Ideal for electronic components, semiconductors, PCB, FPC, LED brackets, auto parts, functional plating, decorative parts, connectors, terminals, sanitary ware, jewelry and other industries for surface coating thickness measurement and material analysis.
Safety Features
- Simple user interface with limited operator authorization
- Supervisor maintenance capabilities
- Automatic operator usage records
- Automatic locking for unauthorized operation prevention
- Sample chamber door sensor
- X-ray warning light
- Front panel security buttons
Key Features
- Measures up to 5 layers (4 coating + substrate) simultaneously
- Analyzes 15 elements with automatic spectral line correction
- High measurement accuracy (to μin) with excellent stability
- Rapid non-destructive measurement (as fast as 10s)
- Analyzes solids and solutions with qualitative, semi-quantitative and quantitative capabilities
- Material identification and classification detection
- Comprehensive data statistics (average, standard deviation, etc.)
- Multiple output options (print, PDF, Excel) with comprehensive reporting
- Measurement position preview with 30× optical magnification
- Global service and technical support
Technical Parameters
| Parameter |
Specification |
| Measurement element range |
Aluminum (Al) - uranium (U) |
| Detector |
SDD |
| Collimator types |
Fixed single hole (0.15mm, 0.2mm, 0.5mm) |
| Optical path system |
Vertical irradiation |
| Magnification |
Optics: 40-60× |
| Display modes |
Elemental spectrum, label pattern, elements and measurement values |
| Camera |
High-definition industrial camera with local magnification |
| Applications |
Single/double coating, alloy coating, electroplating solution |
| Input voltage |
AC220V±10% 50/60HZ |
| Communication |
High-speed USB transmission |
| Dimensions |
555*573*573mm (410*478*245mm cavity) |
| X-ray source |
High-precision micro-focusing light tube (W Target) |
| Software features |
FP algorithm, automatic fault diagnosis/correction, automatic compensation |
Standard Configuration
SDD Semiconductor Detector
- Electrically cooled SDD semiconductor detector
- Resolution: 129 ± 5 EV
- Amplification circuit module for sample characteristic X-ray detection
X-ray Excitation Device
- Maximum filament current output: 1mA
- Semi-loss component, 50W, air cooling
High-pressure Transmitter
- Maximum voltage output: 50kV
- Minimum 5kV controllable adjustment
- Self-contained voltage overload protection