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Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design
Specifications
Brand Name :
Sireda
Model Number :
Open Top
Certification :
ISO9001
Place of Origin :
China
MOQ :
1
Price :
Get Quote
Pitch :
≥0.3mm
Bandwidth :
80G
Pin Count :
2-2000+
Compatible Packages: :
BGA, QFN, LGA, SOP, WLCSP
Socket Type :
Open Top
Conductor Type :
Probe Pins, Pogo Pin, PCR
Description

Non-Destructive BGA Test Sockets | 25GHz High-Speed & Quick-Swap Design

Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap DesignHybrid Elastomer Matrix

Self-healing conductive layers maintain stable contact through thermal cycling (-40°C to +125°C)

Tool-Free Maintenance

Modular design enables full contact grid replacement in under 2 minutes

Universal Compatibility

Adaptable for BGA, QFN, CSP, and PoP test sockets (custom configurations available)

Zero Ball Damage

Compression force controlled within 20-25g/ball (vs. 30g+ industry standard)

Custom Elastomer Test Socket

Property

Parameter

Typical Value

Mechanical

Insertion Cycles

≥30K–50K cycles

Contact Force

15~25g/pin

Operating Temperature

Commercial -40 ~ +125
Military -55 ~ +130

Tolerance

±0.01mm

Electrical

Contact Resistance

<50mΩ

Impedance

50Ω (±5%)

Current

1.5A~3A

Why Choose Our Rubber Test Sockets?

Our elastomeric test sockets offer the perfect balance of performance, durability, and ease of use, ensuring accurate testing while protecting your ICs. Whether you need high-frequency testing for 5G/RF applications, ultra-fine pitch probing, or long-term burn-in reliability, our gentle-contact, low-maintenance design reduces costs and extends the life of your test setup.

✔ No damage to solder balls or pads – Precision force distribution protects your ICs
✔ Long-lasting – 100K+ test cycles with minimal performance degradation
✔ Easy maintenance – Swap contact pins in minutes, no special tools required
✔ High-frequency capable – Reliable signal integrity up to 25GHz
✔ Universal compatibility – Works with BGA, QFN, CSP, PoP & more

Need a custom solution? Contact us today to discuss your IC testing needs—we specialize in bespoke test socket designs for advanced semiconductor applications.

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Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design

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Product Detail
Brand Name :
Sireda
Model Number :
Open Top
Certification :
ISO9001
Place of Origin :
China
MOQ :
1
Price :
Get Quote
Contact Supplier
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design

Sireda Technology Co., Ltd.

Verified Supplier
1 Years
shenzhen
Since 2010
Business Type :
Manufacturer
Main Products :
IC Test Sockets, Test Connector, BGA Test Socket
Total Annual :
10000000-50000000
Employee Number :
101~120
Certification Level :
Verified Supplier
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