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139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
Specifications
Brand Name :
HUATEC
Model Number :
H3543HWC-EG
Certification :
CE ISO GOST
Place of Origin :
China
MOQ :
1
Packaging Details :
export standard carton package
Material :
amorphous silicon sensor
Temperature :
10-35°C (operating)；-10~50°C (storage)
Humidity :
30-70% RH (non-condensing)
Product name :
DR Digital Flat Panel Detector
Receptor Type :
a-Si
Scintillator :
Gos / CsI:TI
Active Area :
350 x 430 mm
Pixel Pitch :
139 μm
Description

139 Micron Amorphous Silicon A-Si For Various Fields Such As DR And Non-Destructive Testing

H3543HWC-EG is a lightweight wireless detector based on amorphous silicon(a-Si), which is suitable for various fields such as DR and Non-destructive testing.

Sensor
Receptor Type a-Si

Scintillator Gos / CsI:TI

Active Area 350 x 430 mm

Resolution 2560 x 3072

Pixel Pitch 139 μm

Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Standby Time 6.5 h

Recharge Time 4.5 h

Image Quality
Limiting Resolution 5 LP/mm

Energy Range 40-160 KV

Dynamic Range ≥76 dB

Sensitivity ≥0.36 LSB/nGy

Ghos <1% 1st frame

DQE 38% @(1 LP/mm)

21% @(2 LP/mm)

MTF 75% @(1 LP/mm)

48% @(2 LP/mm)

28% @(3 LP/mm)

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139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

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Product Detail
Brand Name :
HUATEC
Model Number :
H3543HWC-EG
Certification :
CE ISO GOST
Place of Origin :
China
MOQ :
1
Packaging Details :
export standard carton package
Contact Supplier
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing
139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

HUATEC GROUP CORPORATION

Verified Supplier
17 Years
beijing, beijing
Since 2010
Business Type :
Manufacturer, Exporter, Trading Company
Main Products :
Ultrasonic Flaw Detector, Ultrasonic Thickness Gauge, Coating Thickness Gauge
Total Annual :
600-1000
Employee Number :
50~100
Certification Level :
Verified Supplier
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