Four-Channel 24.5 To 29Gb/S Tunable Error Meter For 100G TOSA/ROSA Devices

The four-channel 24.5~29Gb/s tunable bit error tester is a kind of high-precision and cost-effective test equipment, which is mainly used in the field of optical communication error test.

Product overview
The four-channel 24.529Gb/s tunable error meter is a test instrument that integrates the functions of internal reference clock, graphic signal generator, clock recovery circuit and error analysis. It supports four-channel parallel testing, each channel rate up to 24.529Gb/s, suitable for a variety of high-rate communication devices test requirements.

Product characteristics
High precision and high performance: The error tester can provide high precision error testing to ensure the accuracy and reliability of the test results.
Multi-channel parallel testing: Support four-channel parallel testing, improve the test efficiency, especially for the need to test multiple devices at the same time.
Tunability: The rate range can be tuned from 24.5Gb/s to 29Gb/s to meet the test needs of different rate devices.
Integrated design: A variety of test functions are integrated into one, reducing the size and complexity of the equipment, and improving the ease of use.
Rich test functions: In addition to the basic error test, it also supports the eye map test, transmission system bit rate and characteristic test.
Easy to operate: Usually has a friendly user interface and simple operation flow, so that operators can quickly get started and efficiently complete the test task.

Specification

Scope of application
The four-channel 24.5~29Gb/s tunable error meter has a wide range of applications in the field of optical communication, including but not limited to the following aspects:

Optical transceiver module test: such as CFP2, CFP4, QSFP28, SFP+, XFP and other modules error test.
Photoelectric components and equipment testing: such as TOSA, ROSA, laser and other photoelectric components and equipment error test.
High-speed Integrated Circuit and circuit board testing: Used to test the error performance of Gbps class integrated circuits (ICs) and circuit boards (PCBs).
Serial bus and high-speed backplane design tests: Used to verify the signal integrity and bit error rate of the system during the serial bus and high-speed backplane design process.
Optical transmission network installation testing and troubleshooting: Used to test system error performance and troubleshoot faults during the installation and commissioning of optical transmission network.