A crosshair micrometer (typically used as part of a transmission reticle or stage/eyepiece micrometer) is a high-precision optical measurement standard. It uses high-quality optical glass as a substrate, with clear crosshairs and micron-level graduations etched onto its surface using ultra-precision microfabrication technology. By placing it in the optical path of a microscope (such as inside the eyepiece or on the stage), it allows for precise positioning, alignment, and dimensional measurement of minute objects.

1. Product Features:

(1) High Precision and High Resolution: Utilizing micron-level vacuum coating or photolithography, the lines are extremely fine, uniform, and have clear edges, meeting the stringent measurement requirements of high-magnification microscopes.

(2) Excellent Transmittance: The substrate glass has high transmittance, resulting in clear imaging without affecting the microscope's original optical field of view and contrast.

(3) Strong Wear Resistance and Stability: The graduation layer is firmly bonded to the glass substrate, resistant to acids and alkalis, and abrasion, maintaining accuracy over long periods in typical laboratory and industrial environments.

(4) Good standard compatibility: Diverse specifications and sizes, perfectly adaptable to various biological microscopes, metallurgical microscopes, and industrial measuring microscopes.

2. Application Areas

(1) Precision Manufacturing and Quality Control: Used for microscopic dimensional inspection and surface defect assessment of electronic components, micro-mechanical parts, and precision molds.

(2) Biomedical Research: Used in cytology, pathology, and microbiology to measure the microscopic geometric dimensions of cells, bacteria, microorganisms, and tissue sections.

(3) Materials Science: Used for metallographic analysis of metallic materials, measuring grain size, phase boundary width, and microcrack length.

(4) Optical Instrument Calibration: Used as an optical scale to calibrate the magnification and pixel equivalent of microscope eyepiece micrometers and various image measurement systems.