Infrared Emissivity Detector-TSS-5X-2

At normal temperature, the emissivity of various materials can be measured quickly and conveniently. It is applicable to various research institutions, production lines, numerical measurement of minute changes in surface treatment of various materials, emissivity measurement of heat storage and heat insulation materials, emissivity research and measurement of steel mills and semiconductor materials, etc.
Measurement principle: Detect and calculate the reflected energy of far-infrared radiation generated by a constant-temperature radioactive source.

Main features
1.Understanding the emissivity helps save energy. For instance, the emissivity efficiency of electric heaters can be enhanced, and the design of products should focus on heat dissipation and insulation.
2. The TSS-5X-2 enables easy measurement of emissivity without heating the target at room temperature.
3.When you measure their emissivity, you can use two standard measuring devices with fixed emissivity, one with a black surface emissivity of 0.97 and the other with a mirror emissivity of 0.06.
4.The reflected energy is detected by reading the infrared rays reflected from the target and reaching the sensor head through the small hole in the black body.

Technical specifications:

Measurement wavelength: 2-22μm
Measurement range: Emissivity 0.00-1.00
Measurement accuracy: Within ±0.01
Measured area: Φ15mm
Measurement distance: 12mm
Material temperature: 10-40℃ (room temperature)
Numerical display: LED digital display
Output: 0-0.1V 0-1V Full-Scale
Ambient temperature: 10 to 45℃
Environmental humidity: 35-85% (without condensation)
Power supply: AC220V, 60Hz
External dimensions: Main body H156 x W306 x D230 mm, 2.8Kg
Probe side head Φ51 X 137 mm, 0.6Kg
Accessories: One reference plate each with an emissivity of 0.06 and 0.97, and one storage box.
Manufacturer: Nippon Detector Co., LTD
"General Agent in Chinese Mainland"
Shenzhen Wanyi Technology Co., LTD