The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which are stable, multifunctional, and upgradeable, suitable for experimental research and production in universities, research institutes, and the semiconductor industry.
| Equipment Performance Indicator | Description |
|---|---|
| Magnetic Field Strength | 1 T@air gap 20 mm |
| Magnetic Field Uniformity | ±1%φ1 mm |
| Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.05 mT |
| Air Gap | Adjustable from 0-80 mm |
| Sample Displacement Stage | XY-axis adjustable stroke ±15 mm, adjustment sensitivity 10 μm; T-axis 360-degree electric rotation |
| Probe Seat | 4 groups of DC probes, 1 group of RF probes, 8-pin wire-bonded sample seat |
| Optical Magnification | 0.75 X-5 X |
| Source Meter | SR830, N5173B, Keithley 6221, Keithley 2182A |
| Testing Functions | RH, second harmonic, ST-FMR, spin pumping, all with magnetic field angle testing. |